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Langer EMV-Technik GmbH

展位号: E5-5847

www.langer-emv.de
mail@langer-emv.de

关于我们

Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC.
Our interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand.
Our main products for developers of electronics are high solution near field probes, pre-compliance mini burst generators and optic analoge and digital systems.
The IC testing engineers use our IC Test System with special ESD/EFT generators, IC scanner systems and different probes for emission and interference immunity.
Developers and designers gain new perspectives and more efficient working strategies for module- and IC developments with the EMC know how and measurement technology of Langer EMV-Technik GmbH.



展示产品

Interference emission products:

  • Near field probes with frequency ranges from 100 kHz - 10 GHz
  • Preamplifiers with frequency ranges from 100 kHz - 6 GHz

Interference immunity products:

  • Immunity development system type E1
  • Mini burst generators optical analog or digital signal transmission systems

IC test system:

  • IC scanner system type ICS 105 with high solution (50µm) near field probes
  • IC Test System with different test probes for emission and immunity tests

 

Langer IC scanner type ICS 105

Langer IC scanner type ICS 105

The ICS 105 IC scanner allows measurements near fields above ICs and small assemblies. A magnetic or electric field with a volume of (50 x 50 x 50) mm can be measured and represented via a PC depending on the respective probe. The probe can also be automatically rotated to determine a magnetic field's exact direction. The ICR probes that are available separately are ideal for measurements in the frequency range up to 6 GHz and achieve a spatial resolution of approx. 50μm.

www.langer-emv.de/en/product/langer-scanner/41/ics-1...

新闻和创新

Mini Burst Field Generators type P1 set 

The mini burst generators are particularly small. They are used to identify and eliminate weak points in electronic assemblies in the development phase. They generate a burst or an ESD field at their tip. The mini burst generators are guided by hand across the equipment under test (e.g. printed circuit board) with their field-emitting tips close to its surface. The weak points respond to the pulsed field and malfunctions will occur. The burst generators can be applied to selected individual sections of the circuit board design to identify potential weak points (faults in the ground system, individual traces or IC pins). Separate magnetic (P11 and P12) and electric (P21) coupling allows an optimal adaptation of EMC countermeasures to the respective weak point.

联系方式

地址
Langer EMV-Technik GmbH
Noethnitzer Hang 31
01728 Bannewitz
Germany

电话: +49 351 4300930
传真: +49 351 43004322

Peter Michak
Sales Director
电话: +49 351 43009323
michak@langer-emv.de

代表
Compliance Direction International Ltd.
No.10 Mansion, J6 Creative Industries Park, No.6 Jiangjun Avenue,
Nanjing, Jiangsu 211111
P.R. China

电话: +86 25 58075408
传真: +86 25 58075428

info@emcdir.com
emcdir.com



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