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IC pulse test – P331-2 probe – ESD generator (IEC 61000-4-2)

The P331-2 probe is an ESD generator in accordance with IEC 61000-4-2. Its mini ESD generator design allows direct contact to IC pins. What is special about this ESD generator compared to conventional commercial ones is that there are no additional unintended electric and electric fields which could also interfere with the IC.Conventional commercial ESD generators radiate electric and magnetic emissions via their housings in addition to the disturbance pulse in accordance with IEC 61000-4-2. Tests with conventional commercial ESD generators do not enable the tester to understand whether the disturbance pulse in accordance with IEC 61000-4-2 or the radiated electric or magnetic emissions are responsible for the malfunction of the IC.The P331-2 mini ESD generator design does not allow radiated electric or magnetic emissions to emerge from its housing. It is designed for measurements on all types of IC pins, particularly for measurements on high-speed interfaces such as USB, LVDS, Ethernet, etc. Special two-pole inductive or capacitive couplers are suitable coupling networks. The P331-2 ESD generator can couple to an individual IC pin either directly or via a single-pole coupling network. The coupling networks have to be arranged externally adjacent to the IC pins. The P331-2 can be used to test an IC's ESD protection circuits.

Exhibitor: Langer EMV-Technik GmbH

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